ICT Test Probe 0.75mm
Test Probe

BGA DXC-0076

DXC-0076 BGA Test Probe, Beryllium Copper 20U Gold Plated Spring Pin for IC Chip Testing

Electric current
2.0A
Resistance
35mΩ
Plating
Gold plated 20 U
Material
beryllium copper
DXC-0076 BGA Spring Test Probe
Max Outer Diameter:2mm
Total Length:13.75mm
Rating:12V/2.0A
Spring Force:35g±20%
Max Impedance:35mΩ
Cycle Life:100,000 cycles
Material: Beryllium copper, 20U thick gold plating
DXC-0076 BGA Spring Test Probe
  • High-elastic beryllium copper, stable performance after 100,000 frequent test cycles
  • 20U heavy gold plating resists oxidation & abrasion for precise steady signal transmission
  • Gentle 35g spring force prevents scratch and damage to delicate BGA solder pads
  • Low 35mΩ impedance minimizes power loss, ensures accurate test reading under 2A load
  • Precision machined for tight tolerance, ideal for high-density pin layout of BGA test fixtures
BGA chip test jigs, PCB circuit board inspection fixtures, semiconductor burn-in testing, precision IC function verification. Custom tip shape, spring force and dimensions available.